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2005 Annual
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CMP Users Group
- Proceedings
December, 2003
Effects of Aqueous Solution Chemistry on the Accelerated Cracking of Nanoporous Thin Films
Eric Guyer, Stanford University
Equipment and Material Integration Challenges
Lubab Sheet, Semi
Integration Issues With Cu CMP
Mike Oliver, Rodel
Modeling of pattern dependent pressure non-uniformity at die-scale for an integrated CMP model
Jihong Choi, UC Berkley
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