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2005 Annual
Symposium Papers


CMP Users Group - Proceedings
December, 2003

Effects of Aqueous Solution Chemistry on the Accelerated Cracking of Nanoporous Thin Films
  Eric Guyer, Stanford University

Equipment and Material Integration Challenges
  Lubab Sheet, Semi

Integration Issues With Cu CMP
  Mike Oliver, Rodel

Modeling of pattern dependent pressure non-uniformity at die-scale for an integrated CMP model
  Jihong Choi, UC Berkley

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