|
August 2007
Advanced Thin Films:
Grain Focused Modeling and Simulation (5.2MB pdf)
- Timothy S. Cale, Max Bloomfield, RPI, Arizona State University, and Process Evolution, Ltd.
Probing Plasticity at Small Scales: From Electromigration in Advanced Cu Interconnects to Dislocation Starvation in Au Nanopillars (3.5MB pdf)
- Dr. Arief Suriadi Budiman, Dept. of Materials Science & Engineering, Stanford University, CA, suriadi@stanford.edu
|
