Announcements
Proceedings
Committee
Schedule
About
Join
TF Users Group
- Proceedings
February, 2005
Metrology of: SOI, SiGe/SGOI, Strained Si, Bipolars and others
Laurent Kitzinger, SOPRA SA
Modern SOI Materials
Jean-Pierre Colinge, University of California, Davis
SiGe Epi deposition for NPN HBT base layer
Sagy Levy, Cypress Semiconductor Process R&D
© Copyright 2008 American Vacuum Society
